Measurement-computing Daq PC-Card Manual do Utilizador descarregar pdf (Página 18)

1-10 DaqBoard [ISA Type] Quick Start Guide

01-11-00

457-0942, rev 1.2

Resource Tests

The resource tests are intended to test system capability for the current device

configuration. These tests are pass/fail. Resource test failure may indicate a lack of

availability of the resource or a possible resource conflict.

Base Address Test - Tests the base address for the selected parallel port. Failure of

this test may indicate that the parallel port is not properly configured within the

system. See relevant operating system and computer manufacturer’s documentation

to correct the problem.

Interrupt Level Test

- Tests the ability of the parallel port to generate interrupts.

Failure of this test may indicate that the parallel port may be currently unable to

generate the necessary hardware interrupt.

Note:

Other parallel port devices may work fine in this mode. Some parallel port

devices (such as printers) do not require interrupts to work properly. See

relevant operating system and computer manufacturer’s documentation to

correct the problem.

DaqBoard Properties Tab

Performance Tests

Performance tests check various DaqBoard functions with the current device

configuration. These tests give quantitative results for each supported functional

group. The results represent maximum rates at which the various operations can be

performed. Note that the rates depend on selected parallel port protocol and will

vary according to port hardware capabilities.

ADC FIFO Input Speed - Tests the maximum rate at which data can be transferred

from the DaqBoard’s internal ADC FIFO to computer memory, through the PC’s

parallel port. Results are given in samples/second, where a sample (2 bytes in

length) represents a single A/D value.

Digital I/O Input Speed - Tests the maximum rate at which DIO input data can be

transferred from DaqBoard’s Digital I/O ports to computer memory, through the

PC’s parallel port. Results are given in bytes/second.

Digital I/O Output Speed – Tests the maximum rate at which DIO output data can be

transferred from the computer’s memory to DaqBoard’s Digital I/O ports, through

the PC’s parallel port. Results are given in bytes/second.

Test Hardware Tab

Test Results

Note:

If you experience difficulties, please consult your user documentation before calling for technical support. Note that

the user documentation includes a troubleshooting chapter, as well as a great deal of information regarding specific

DBK cards and modules.

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